Process Control

October 3 - 6, 2021 | Atlanta, GA USA

Sign up for updates


Process Control (PC)

Paper

Powered by

PaperCon


The Process Control track focuses on process measurement and control. 


 

Process Control Technical Program

The program is currently under development and subject to change. Visit our website often for program updates.

           
Monday, October 3, 2021
 
           
1:30pm - 3:00pm ET
PC1: Drive Towards: Better Applications
 
    Session Chair: Seyhan Nuyan, Valmet  
      PC1.1 Method for Analyzing Cross-Direction Basis Weight Profile on Multi-Ply Machines Kim William Robinson, Process Solutions Group
      PC1.2 CD Actuator Mapping Expression and Analysis Shih-Chin Chen, ABB
      PC1.3 Lessons Learned in Alarm Management Dave Strobhar, Beville Engineering, Inc.
           
3:30pm - 5:00pm ET
PC2: Thrive with Effective Use of Data
 
    Session Chair: Ian Journeaux, Georgia-Pacific  
      PC2.1 Cloud Connected QCS – Achieving Sustained Peak Performance with Limited Resources Peter De Nicola, Honeywell
      PC2.2 Advanced Data Strategies for Papermaking Optimization Donald Stanley III, ABB
      PC2.3 Big Data Analytics: Lessons Learned and Case Studies John Antanies, Envoy Development
           
Tuesday, October 5, 2021
 
8:00am - 10:00am ET
PC3-M5A3: Visions for Mill Automation Success (Joint Session)
    Session Chair: David Worzalla, International Paper & Laurie Dieffenback, OSISoft
      PC3-M5A3.1 Data Shaping for Big Analytics Marianna Sandin, OSIsoft
      PC3-M5A3.2 Online Data Analysis for Process Optimization Hannes Vomhoff, Holmen AB
      PC3-M5A3.3 Industry 4.0 - A Must Way Forward for Our Pulp and Paper Industry Robert White, Pulmac Systems International
      PC3-M5A3.4  A New Approach to a Manufacturing Execution System and Digital Twin  Chris Harris, WPR Services LLC
           
1:30pm - 3:00pm ET
PC4: Machine Vision to Help You Excel - 1
 
    Session Chair: Brian Mock, Event Capture Systems  
      PC4.1 Technical Advances in Web Inspection and Process Efficiency Pete Angle, ISRA VISION
      PC4.2 Increasing Uptime in WIS and Event Capture Solutions with Server Virtualization Wesley Sweeny, Procemex
      PC4.3 Comprehensive Performance Tests of the Paper Product Formation and Surface Appearance Quality Analysis and Classification System Myron Laster, ABB
           
Wednesday, October 6, 2021
 
 8:00am - 10:00am ET  
PC5: Make Your Field Devices Thrive
 
     Session Chair: TBD  
       PC5.1 Does Humidity Matter in a Corrosive Environment? Mark Bradham, Advance Industrial Refrigeration
      PC5.2 Consistency Measurement and Basic Tenets of Loop Design Craig Hannah, Valmet
      PC5.3 Process Control Is As Easy As 1, 2, Total Insight Chris Costlow and Cherlyn Marlow, Yokogawa
      PC5.4 Gremlins Lurking on Circuit Boards David Zerr