Process Control

May 1 - 4, 2022 | Charlotte, NC USA

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Process Control (PC)

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The Process Control track focuses on process measurement and control. 


 

Process Control Technical Program

The program is currently under development and subject to change. Visit our website often for program updates.

           
Monday, October 4, 2021
 
           
1:30pm - 3:00pm ET
PC1: Drive Towards: Better Applications
 
    Session Chair: Seyhan Nuyan, Valmet  
      PC1.1 A Method for Analyzing Basis Weight Profile in Recycled Paper Mills Kim William Robinson, Process Solutions Group
      PC1.2 CD Actuator Mapping Expression and Analysis Shih-Chin Chen, ABB
      PC1.3 Lessons Learned in Alarm Management Dave Strobhar, Beville Engineering, Inc.
           
3:30pm - 5:00pm ET
PC2: Thrive with Effective Use of Data
 
    Session Chair: Ian Journeaux, Georgia-Pacific  
      PC2.1 Cloud Connected QCS Peter De Nicola, Honeywell
      PC2.2 Advanced Data Strategies for Papermaking Optimization Donald Stanley III, ABB
      PC2.3 Big Data Analytics: Lessons Learned and Case Studies Monica Bastola, Envoy Development
           
Tuesday, October 5, 2021
 
8:00am - 10:00am ET
PC3: Make Your Field Devices Thrive
    Session Chair: James Wardlaw, WestRock
      PC3.1 Specifications for Effective Electrical Room Corrosion Control Mark Bradham, Advance Industrial Refrigeration
      PC3.2 Consistency Measurement and Basic Tenets of Loop Design Craig Hannah, Valmet
      PC3.3 Total Insight Enables Digital Transformation at the Edge for Sustainable, Continuous Business Operations Improvement Chris Costlow and Cherlyn Marlow, Yokogawa
      PC3.4 Gremlins Lurking on Circuit Boards David Zerr, Consultant
           
1:30pm - 3:00pm ET
PC4: Machine Vision to Help You Excel - 1
 
    Session Chair: Brian Mock, Event Capture Systems  
      PC4.1 Technical Advances in Web Inspection and Process Efficiency Pete Angle, ISRA VISION
      PC4.2 Increasing Uptime in WIS, Web Monitoring and Event Capture Solutions with Server Virtualization Wesley Sweeny, Procemex
      PC4.3 Comprehensive Performance Tests of the Paper Product Formation and Surface Appearance Quality Analysis and Classification System Myron Laster, ABB
           
3:30pm - 5:00pm ET
PC5-PF3: Mechanical Performance (Joint Session)
    Session Chair: D. Steven Keller, Miami University  
      PC5-PF3.1 Understanding Wet Tear Stranth at Varying Moisture Content in Handsheets Adele Panek, WestRock
      PC5-PF3.2 Historial Perspectives of Corrugated Box Testing for 2021 Douglas Coffin, Miami University
      PC5-PF3.3 Steady-State Tearing in Copy Paper Exhibits Three Stages of Deformation Sarah Paluskiewicz, Georgia Institute of Technology
           
Wednesday, October 6, 2021
 
 8:00am - 10:00am ET  
PC6-PM6: It's a Science - How to Handle Big Data (Joint Session)
 
     Session Chair: Paula Hajakian, USG  
      PC6-PM6.1 Machine Learning Algorithm for Online Identification of Wet End Stability Torsten Haverinen-Nielsen, Kemira Chemicals, Inc. (Presented by Meagan Walker, Kemira Chemicals, Inc.)
      PC6-PM6.2 Asset and Process Insight, Driven by Data Analytics Andrew Wyse and Philip Armstrong, Jacobs
      PC6-PM6.3 Using Process Information Survey Techniques to Support Gap Closure David Burton, AstenJohnson
      PC6-PM6.4 Optimizing Mill Effectiveness Through Statistical Process Control (SPC) Kim William Robinson, Process Solutions Group
           
10:30am -12:00pm ET
PC7:  Mini Tutorials to Drive Control Acumen
 
     Session Chair: David Worzalla, International Paper  
      PC7.1 CD Mapping Spreadsheets Mini-Tutorial Calvin Fu, Valmet (Presented by Seyhan Nuyan, Valmet)
      PC7.2 Reel Stats Additional Methods Mini-Tutorial  Ian Journeaux, Georgia-Pacific
      PC7.3 Machine Direction Control Fundamentals Mini-Tutorial Kerry Figiel, International Paper
           
1:30pm -3:00pm ET
PC8:  Machine Vision to Help You Excel - 2
    Session Chair: Pete Angle, ISRA Vision  
      PC8.1 How to Detect Dirt and Shives in Pulp Slurries David Zerr, Consultant
      PC8.2 How Deep Learning is Used to Increase the Quality Control of Wood Chips by Classification. Phase II - Model Development and Application Results Brian Mock, Event Capture Systems
      PC8.3 Online Web Inspection System Using Transmitted Light Jason Leiby, International Paper